The instrument features high spatial resolution and spot sizes down to 100 µm. Arbitrarily shaped samples, like the most intricate pieces of jewelry, can be analyzed without further preparation, and even more important – nondestructively. Samples sizes of up to 100x100x100 mm³ are supported. A video microscope with cross hair-functionality facilitates exact pinpointing of the desired measurement location. The motorized Z-stage allows fast focusing. The optionally available X-Y-Z stage provides even more comfort.
The M1 MISTRAL is equipped with a high brightness micro-focus X-ray tube that ensures excellent excitation of the measurement spot resulting in a high fluorescence yield. With its powerful, yet easy-to-use, XSpect software suite, the instrument delivers accurate quantification results, no matter whether analyzing bulk materials or the most complicated multi-layer structures.
Non-destructive analysis of arbitrarily shaped samples
The M1 MISTRAL as a spectrometer for the accurate analysis of bulk and coating samples using small spot X-ray fluorescence analysis (Micro-XRF). Operating in ambient air, all elements from titanium (Z=22) upwards can be analyzed. This permits investigation of a wide range of different sample categories, including metals, alloys and metallic multi-layer systems.
Even large samples with sizes up to 100x100x100 mm³ can be analyzed. Excitation and fluorescence radiation detection takes place from above, without sample contact. This allows measurement on differently shaped samples, from flat surfaces of some GMF products to the most intricately shaped piece of jewelry.
Measurement with high spatial resolution
The M1 MISTRAL is equipped with a high brilliance micro-focus X-ray tube, which is capable of producing a high excitation intensity, even if a the smallest available collimator is used to produce a spot size of a mere 100 µm. Measurement locations can be pinpointed exactly, using the combination of video microscope and the optional motorized X-Y-Z stage.
Flexible detector configurations
The M1 MISTRAL is available in two different detector configurations, either with a large active area gas filled proportional counter for standard applications in quality control or with a silicon drift detector (SDD) for superior speed and energy resolution. The design of the detection and signal processing system warrants maximum efficiency and therefore quick results.
The XSpect/XS-Tools software suite provides a measurement management from spectra acquisition, via evaluation to reporting. Its tools support the analysis of bulk samples and coatings, using either standard-based quantification or a standardless Fundamental Parameter model. Reliable results can be obtained easily and routine measurements can be stored for automated reuse.
Easy to use and maintenance-free
Both the software and the M1 MISTRAL itself are designed for use by personnel that may only have received introductory training to the system. Two power outlets are all that is required to run the system. Consumables are not needed, as air-cooling is sufficient.